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GaN-SI型半绝缘氮化镓单晶片规范
参考页数：21
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SiC-HPSI型高纯半绝缘碳化硅单晶片规范
参考页数：25
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半导体技术材料试验. 液体中微量元素的测定-第7部分：电感耦合等离子体质谱法测定高纯盐酸中的31种元素
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
参考页数：14P.;A4
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改良西门子法多晶硅用硅芯
Silicon core for polysilicon by improved siemens method
参考页数：8P.;A4
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碲化镉
Cadmium telluride
参考页数：12P.;A4
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单晶炉用碳/碳复合材料坩埚
Carbon-carbon composites crucible used in single crystal furnace
参考页数：10P.;A4
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非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法
Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage
参考页数：15P.;A4
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二氧化硒
Selenium dioxide
参考页数：6P.;A4
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锗粒
Germanium grain
参考页数：7P.;A4
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硅抛光回收片
Polished reclaimed silicon wafers
参考页数：13P.;A4
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