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硅单晶中碳、氧含量的测定 低温傅立叶变换红外光谱法
Test method for carbon and oxygen content of single crystal silicon.Low temperature fourier transform infrared spectrometry
价格：￥0.00
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用区熔法和光谱分析法评价颗粒状多晶硅的规程
Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies
价格：￥0.00
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蓝宝石晶体X射线双晶衍射摇摆曲线测量方法
Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
价格：￥0.00
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蓝宝石拋光衬底片表面残留金属元素测量方法
Measurement method for surface metal contamination on sapphire polished substrate wafer
价格：￥0.00
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低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法
价格：￥0.00
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蓝宝石单晶晶向测定方法
Test method for determining the orientation of sapphire single crystal
价格：￥14.00
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蓝宝石单晶位错密度测量方法
Test method for dislocation density of sapphire single crystal
价格：￥14.00
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硅外延层晶体完整性检验方法 腐蚀法
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
价格：￥0.00
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硅片翘曲度测试 自动非接触扫描法
Test method for warp of silicon wafers.Automated non-contact scanning method
价格：￥0.00
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氮化镓单晶衬底片x射线双晶摇摆曲线半高宽测试方法
Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
价格：￥16.00
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