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使用SIMS测量溅镀深度剖面接口宽度的标准指南
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
参考页数:3P.;A4
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使用SIMS测量溅镀深度剖面接口宽度的标准指南
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
参考页数:3P.;A4
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多晶材料 中子衍射法测定剩余应力
Polycrystalline materials - Determination of residual stresses by neutron diffraction
参考页数:61P.;A4
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确定晶片坐标系规范
Specification for establishing a wafer coordinate system
参考页数:6
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晶片通用网格规范
Specification for a universal wafer grid
参考页数:8
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锗晶体缺陷图谱
Collection of metallographs on defects of crystalline germanium
参考页数:40
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碲化镉
Cadmium telluride
参考页数:12P.;A4
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非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法
Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage
参考页数:15P.;A4
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硅抛光回收片
Polished reclaimed silicon wafers
参考页数:13P.;A4
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半导体中深能级的瞬态电容.测试方法
Test method for characterizing semiconductor deep levels by transient capacitance techniques
参考页数:7P.;A4
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