|
硅片表面金属沾污的全反射X光荧光光谱测试方法
Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
价格：￥0.00
|
|
|
|
|
|
热解吸气相色谱法测定硅片表面的有机污染物
Test methods for analyzing organic contaminants on silicon water surfaces by thermal desorption gas chromatography
价格：￥0.00
|
|
|
|
|
|
高分辩率X射线衍射测量GaAs衬底生长的AlGaAs中Al成分的试验方法
Test method for measuring the Al fraction in on AlGaAs substrates by high resolution X-ray diffraction
价格：￥0.00
|
|
|
|
|
|
硅和外延片表面Na、Al、K和Fe的二次离子质谱检测方法
Test method for measuring surface sodium, aluminum, potassium, and iron on silicon and epi substrates by secondary ion mass spectrometry
价格：￥0.00
|
|
|
|
|
|
硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法
Test methods for photolumininescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities
价格：￥0.00
|
|
|
|
|
|
硅材料原生缺陷图谱
Metallographs collection for original defects of crystalline silicon
价格：￥0.00
|
|
|
|
|
|
用栅控和非栅控二极管的电压电容关系测定硅外延层中净载流子浓度的方法
Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
价格：￥0.00
|
|
|
|
|
|
空间红外探测器碲镉汞外延材料参数测试方法
Measuring methods of parameters of HgCdTe epilayers used for space infrared detectors
价格：￥0.00
|
|
|
|
|
|
|
|
半导体材料牌号表示方法
Designations of semiconductor materials
价格：￥0.00
|
|
|
|
|
