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砷化镓外延片
Gallium arsenide epitaxy wafers
参考页数：12P.;A4
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半导体变流器.总要求和线路整流转换器.第1-1部分:基本要求规范
Semiconductor converters.General requirements and linecommutated converters.Part 1-1: Specification of basic requirements
参考页数：100P.;A4
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压塑交叉连接的热塑性半导体、导体和绝缘屏蔽材料的体电阻纵向测量的试验方法
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
参考页数：3P.;A4
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压塑交联和热塑性半导体导管和绝缘防护材料用规范
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting@ Conductor and Insulation Shielding Materials
参考页数：2P.;A4
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静电放电敏感元件的保护用ESD协会草案标准规程.两点电阻测量
ESD Association Draft Standard Practice for the Protection of Electrostatic Discharge Susceptible Items - Two-Point Resistance Measurement
参考页数：
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半导体变流器.总要求和线路整流转换器.第1-1部分:基本要求规范
Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
参考页数：194P;A4
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半导体转换器.一般要求和电网整流转换器.第1-2部分:应用指南
Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guide
参考页数：88P.;A4
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半导体工艺用材料测试. 液体中痕量元素测定. 第6部分: 测定含有氢氟酸的高纯度氟化铵溶液蚀刻混合物和高纯度氟化铵溶液 (NH4F) 中的36种元素
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH4F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
参考页数：14P.;A4
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半导体工艺用材料测试. 液体中痕量元素测定. 第3部分: 使用电感耦合等离子体质谱法 (ICP-MS) 测定高纯度硝酸中的31种元素
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
参考页数：19P.;A4
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半导体工艺材料检验.液体中痕量元素测定.用原子吸收光谱测定法测定硝酸溶剂中银、金、钙、铜、铁、钾和钠的含量
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
参考页数：8P.;A4
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