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高纯四氯化锗
High pure germanium tetrachloride
参考页数：12P.;A4
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蓝宝石单晶抛光片规范
Sapphire single crystal polished wafers specification
参考页数：9P.;A4
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碳化硅单晶抛光片表面质量的测试方法
Test method for measuring surface quality of polished monocrystalline silicon carbide
参考页数：6P.;A4
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碳化硅单晶抛光片表面粗糙度的测试方法
Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers
参考页数：10P.;A4
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碳化硅单晶抛光片规范
Specification for polished monocrystalline silicon carbide wafers
参考页数：17P.;A4
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碳化硅单晶晶型的测试方法
Test method for determining crystal type of monocrystalline silicon carbide
参考页数：9P.;A4
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碳化硅单晶晶向的测试方法
Test method for measuring crystallographic orientation of monocrystalline silicon carbide
参考页数：6P.;A4
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碳化硅单晶电学性能的测试方法
Test method for measuring electrical properties of monocrystalline silicon carbide
参考页数：10P.;A4
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砷化镓晶片热稳定性的试验方法
Test method for thermal stability testing of gallium arsenide wafers
参考页数：6P.;A4
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红外吸收法测量砷化镓中硼含量
Determination of boron concentration in gallium arsenide by infrared absorption
参考页数：8P.;A4
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