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电子元件. 电子半导体设备的长期储存. 第4部分: 储存(IEC 62435-4-2018); 德文版本EN IEC 62435-4-2018
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2018); German version EN IEC 62435-4:2018
参考页数:26P.;A4
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电子元件. 电子半导体设备的长期储存. 第4部分: 储存(IEC 62435-4-2018); 德文版本EN IEC 62435-4-2018
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2018); German version EN IEC 62435-4:2018
参考页数:26P.;A4
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用于电子薄膜的纯铝(非合金)材料标准规范
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
参考页数:2P.;A4
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测量数字集成电路 (米制) 混乱用剂量率阀值的标准试验方法
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
参考页数:7P.;A4
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作为中子光谱传感器和位移破坏性监测器的2N2222A硅双极晶体管使用的标准试验方法
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
参考页数:10P.;A4
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用于电子薄膜的纯铝(非合金)材料标准规范
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
参考页数:2P.;A4
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测量数字集成电路 (米制) 混乱用剂量率阀值的标准试验方法
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
参考页数:7P.;A4
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作为中子光谱传感器和位移破坏性监测器的2N2222A硅双极晶体管使用的标准试验方法
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
参考页数:10P.;A4
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电子元件. 电子半导体设备的长期储存. 第4部分: 储存(IEC 62435-4-2018); 德文版本EN IEC 62435-4-2018
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2018); German version EN IEC 62435-4:2018
参考页数:26P.;A4
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电磁兼容性(EMC)集成电路(IC)模型. 第1部分: 一般模型结构
EMC IC modelling - Part 1: General modelling framework
参考页数:59P.;A4
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