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WEEE的收集、物流和处理要求. 第4部分：与WEEE相关的收集和物流规范；德文版CLC / TS 50625-4:2017
Collection, logistics & treatment requirements for WEEE - Part 4: Specification for the collection and logistics associated with WEEE; German version CLC/TS 50625-4:2017
参考页数：22P.;A4
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半导体器件. 微电机设备. 第6部分: 薄膜材料的轴向疲劳试验方法（IEC 62047-6: 2009）; 德文版本EN 62047-6: 2010
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010
参考页数：17P;A4
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半导体器件.微电机器件.第4部分:MEMS一般要求(IEC 62047-4-2008);德文版本EN 62047-4-2010
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008); German version EN 62047-4:2010
参考页数：22P;A4
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电子设备的电机元件.基本试验程序和测量方法.第20-2部分:试验:20b.易燃性试验.阻燃性
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test: 20b: Flammability tests; Fireproofness (IEC 60512-20-2:2000); German version EN 60512-20-2:2000
参考页数：10P.;A4
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半导体器件. 微型机电装置. 第15部分: PDMS和玻璃之间粘结强度的试验方法 (IEC 62047-15-2015); 德文版本EN 62047-15-2015
Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass (IEC 62047-15:2015); German version EN 62047-15:2015
参考页数：13P.;A4
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半导体装置.微型电机装置.第2部分:薄膜材料的拉伸试验方法
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006); German version EN 62047-2:2006
参考页数：14P.;A4
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半导体器件.微电机设备.第3部分:拉伸试验用薄膜标准试验片
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
参考页数：9P.;A4
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电信和电子设备变压器和感应器.线圈架主要尺寸.第1部分:叠层铁芯线圈架
Transformers and inductors for use in telecommunication and electronic equipment - Main dimensions of coil formers - Part 1: Coil formers for laminated cores (IEC 61797-1:1996); German version EN 61797-1:1996
参考页数：23P.;A4
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电子设备的机电元件.基本检验程序和测量方法.第1部分:一般检测.第3节:1c检验.电气啮合长度
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General examination; Section 3: Test 1c: Electrical engagement length (IEC 60512-1-3:1997); German version EN 60512-1-3:1997
参考页数：5P.;A4
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电子设备连接器. 试验和测量. 第17-3部分:电缆夹紧试验. 试验17c:电缆夹抗拉(抗拉)
Connectors for electronic equipment -- Tests and measurements -- Part 17-3: Cable clamping tests -- Test 17c: Cable clamp resistance to cable pull (tensile)
参考页数：6P;A4
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