|
硅外延片
Silicon epitaxial wafers
价格：￥0.00
|
|
|
|
|
|
硅片参考面结晶学取向X射线测试方法
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
价格：￥0.00
|
|
|
|
|
|
硅及其他电子材料晶片参考面长度测量方法
Test method for measuring flat length wafers of silicon and other electronic materials
价格：￥0.00
|
|
|
|
|
|
硅抛光片表面质量目测检验方法
Standard method for measuring the surface quality of polished silicon slices by visual inspection
价格：￥0.00
|
|
|
|
|
|
硅片表面平整度测试方法
Testing methods for surface flatness of silicon slices
价格：￥0.00
|
|
|
|
|
|
硅片弯曲度测试方法
Test method for bow of silicon wafers
价格：￥0.00
|
|
|
|
|
|
硅片厚度和总厚度变化测试方法
Test method for thickness and total thickness variation of silicon slices
价格：￥0.00
|
|
|
|
|
|
硅片电阻率测定 扩展电阻探针法
Test method for measuring resistivity of silicon wafer using spreading resistance probe
价格：￥0.00
|
|
|
|
|
|
半导体硅片电阻率及硅薄膜薄层电阻测试方法 非接触涡流法
Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
价格：￥0.00
|
|
|
|
|
|
硅多晶断面夹层化学腐蚀检验方法
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
价格：￥0.00
|
|
|
|
|
