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半导体器件. 机械和气候试验方法. 第26部分: 静电放电敏感性(ESD)测试. 人体模型(HBM)(IEC 60749-26-2018); 德文版本EN IEC 60749-26-2018
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
参考页数：59P.;A4
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半导体器件.机械和气候试验方法.振动,可变频率
Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
参考页数：10P.;A4
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半导体装置.机械和气候试验方法.盐雾气氛
Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere
参考页数：20P.;A4
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半导体器件的机械标准.分立器件外形图准备的一般规则
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of discrete devices
参考页数：44P.;A4
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半导体器件.机械和气候试验方法.第12部分:变频振动(IEC 60749-12-2017); 德文版本EN IEC 60749-12-2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
参考页数：8P.;A4
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半导体器件的机械标准化. 第1部分: 分立器件外形图的一般规则(IEC 60191-1-2018); 德文版本EN IEC 60191-1-2018
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (IEC 60191-1:2018); German version EN IEC 60191-1:2018
参考页数：41P.;A4
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半导体器件. 机械和气候试验方法. 第13部分: 盐性环境(IEC 60749-13-2018); 德文版本EN IEC 60749-13-2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
参考页数：15P.;A4
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半导体器件. 机械和气候试验方法. 第26部分: 静电放电敏感性(ESD)测试. 人体模型(HBM)(IEC 60749-26-2018); 德文版本EN IEC 60749-26-2018
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
参考页数：59P.;A4
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电绝缘半导体装置安全性标准
UL Standard for Safety Electrically Isolated Semiconductor Devices (Sixth Edition)
参考页数：25P.;A4
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半导体器件.机械和气候试验方法.第28部分:静电放电(ESD)灵敏度试验.带电器件模型(CDM).器件级(IEC 60749-28-2017);德文版本EN 60749-28-2017
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
参考页数：50P.;A4
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