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硅退火片规范
Specification for silicon annealed wafers
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硅片载流子复合寿命的无接触微波反射光电导衰减测试方法
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
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硅晶片上浅腐蚀坑检测的测试方法
Practice for shallow etch pit detection on silicon
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硅单晶抛光试验片规范
Specification for polished test silicon wafers
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太阳电池用硅单晶
Monocrystalline silicon of solar cell
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太阳能电池用砷化镓单晶
Gallium arsenide single crystal for solar cell
价格:¥0.00
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半导体材料术语
Semiconductor materials-Terms and definitions
价格:¥0.00
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硅外延层载流子浓度测定.汞探针电容-电压法
Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
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硅晶体中间隙氧含量径向变化测量方法
Testing method for determination of radial interstitial oxygen variation in silicon
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硅外延层、扩散层和离子注入层薄层电阻的测定.直排四探针法
Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array
价格:¥0.00
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