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硅抛光片氧化诱生缺陷的检验方法
Test method for detection of oxidation induced defects in polished silicon wafers
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硅中代位碳原子含量.红外吸收测量方法
Test method for substitutional atomic carbon concent of silicon by infrared absorption
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半导体单晶晶向测定方法
Testing methods for determining the orientation of a semiconductor single crystal
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硅晶体完整性化学择优腐蚀检验方法
Testing method for crystallographic perfection of silicon by preferential etch techniques
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硅和锗体内少数载流子寿命测定光电导衰减法
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
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硅单晶电阻率测定方法
Test method for measuring resistivity of monocrystal silicom
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酸浸取.电感耦合等离子质谱仪测定多晶硅表面金属杂质
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
价格：￥0.00
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低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法
Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities
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重掺n型硅衬底中硼沾污的二次离子质谱检测方法
Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
价格：￥0.00
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酸浸取.原子吸收光谱法测定多晶硅表面金属污染物
Test methods for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
价格：￥0.00
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